ACF absorption correction factor
A/D analog to digital (converter)
ADF annular dark field
AEM analytical electron microscope/microscopy
AES Auger electron spectrometer/spectroscopy
AFF aberration-free focus
ALCHEMI atom location by channeling-enhanced microanalysis
APB anti-phase domain boundary
ATW atmospheric thin window
BF bright field
BFP back focal plane
BSE backscattered electron
乌氏
粘度计原理
BSED backscattered-electron diffraction解冻文学
BZB Brillouin-zone boundary
C(1,2,etc..)condenser (l, 2, etc.) lens
CB coherent bremsstrahlung
CBED convergent-beam electron diffraction
CBIM convergent-beam imaging
CCD charge-coupled device
CCF cross-correlation function
CCM charge-collection microscopy
CDF centered dark field
CF coherent Fennel/Foucault
CFEG cold field-emission gun
CL Cathodeoluminescence
CRT cathode-ray tube
CS crystallographic shear
CSL coincident-site lattice
DF dark field
DOS density of states
DP diffraction pattern
DQE detection of quantum efficiency
DSTEM dedicated scanning transmission electron microscopy
DTSA desktop spectrum analyzer
EBIC electron beam-induced current/conductivity
EELS electron energy-loss spectrometry
EFI energy-filtered imaging
ELNES energy-loss near-edge structure
ELP energy-loss program (Gatan)
EMMA electron microscope microanalyzer
EMS electron microscopy image simulation
EPMA electron probe microanalyzer
ESCA electron spectroscopy for chemical analysis
ESI electron spectroscopic imaging
03年高考作文 EXAFS extended X-ray absorption fine structure
EXELFS extended energy-loss fine structure
FCF fluorescence correction factor
FEG field-emission gun
FET field-effect transistor
FFT fast Fourier transform
FOLZ first-order Laue zone
FSE fast secondary electron
FTP file transfer protocol
FWHM full width at half maximum
宿州学院学报 FWTM full width at tenth maximum GB grain boundary
GCS generalized cross section
GIF Gatan image filter
GOS generalüed oscillator strength
HAADF high-angle annular dark field
HOLZ higher-order Laue zone
HPGe high-purity germanium
HRTEM high-resolution transmission electron microscope/microscopy
HV high vacuum
HVEM high voltage electron microscope/microscopy
IDB inversion domain boundary
IEEE International Electronics and Electrical Engineering
IG intrinsic Ge
IVEM intermediate voltage electron microscope/microscopy
K-M Kossel-M?llenstedt
LEED low-energy electron diffraction
LLS linear least-squares
主题词表LUT look-up table
MC minimum contrast
MCA multichannel analyzer
MDM minimum detectable mass
MLS multiple least-squares
MMF minimum mass fraction
MSDS material safety data sheets
NCEMSS National Center for Electron Microscopy simulation system
NIH National Institutes of Health
NIST National Institute of Standards and Technology
OR orientation relationship
OTEDP oblique-textured electron diffraction pattern
PB phase boundary
P/B peak-to-background ratio
PEELS parallel electron energy-loss spectrometer/spectroscopy
PIMS Precision Ion-Milling System
PIPS Precision Ion-Polishing System
PM photomultiplier
POA phase-object approximation
QHRTEM quantitative high-resolution transmission electron microsc.
RB translation boundary (yes, it does!)
RCP rocking-beam channeling patterns
RDF radial distribution function
REM reflection electron microscope/microscopy
RHEED reflection high-energy electron diffraction
RHF relativistic Hartree-Fock
RHFS relativistic Hartree-Fock-Slater
SAD selected-area diffraction
SE secondary electron
SEELS serial electron energy-loss spectrometer/spectrometry
SEM scanning electron microscope/microscopy
SF stacking fault
SHRLI simulated high-resolution lattice images
SIMS secondary ion mass spectrometry
S/N signal-to-noise ratio
SOLZ second-order Laue zone
SRM standard reference material
STEM scanning transmission electron microscope/microscopy
STM scanning tunneling microscope/microscopy
TB twin boundary
TEM transmission electron microscope/microscopy
TMBA too many bloody acronyms
UHV ultrahigh vacuum
UTW ultra thin window
V/F voltage to frequency (converter)
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