专利名称：IN-CIRCUIT TESTER OF CIRCUIT INTERFACE 发明人：UEIN AARU CHISUMU 阎霄汉申请号：JP18720689
申请日：19890718asp投票系统
多媒体课件制作工具公开号：JPH0279655A
公开日：
我是谁 公益广告
19900320
摘要：PURPOSE: To conduct a test in an automatic circuit for a subscriber interface circuit by executing pin check and whole function test irrespective of surrounding components through the use of various separation technology. CONSTITUTION: A probe 210 is physically brought into contact with the pin and the pad of a printed circuit board for the input line and the output line of SLIC(subscriber line interface circuit) 110. SLIC 110 is electrically separated from the surrounding circuit elements by guarding, digital overdriving and analog overdriving. A computer 220 controls a scanning relay 230 and adds a test signal to SLIC 110. Thus, the signals of transmission, telecommunication, hook status, ringing and ring trip are selectively generated from SLIC 110. The respective signals are compared with expected signals. When they do not correspond one another, a fail signal is outputted. Thus, pin check and whole function test can be executed at high speed for SLIC 'in the circuit'.
传统与现代申请人：HEWLETT PACKARD CO
豫公网安备41160202000603
站长QQ:729038198
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