红外感应水龙头摘 要
现代科学技术的发展，要求材料工作者能够及时提供精确的材料信息，而准确标定电子衍射花样是获得材料结构信息，研究物质的微观组织，晶体结构和测定固态试样微区化学成分的重要手段．因此准确标定电子衍射花样是应该掌握的． 本文在前人的基础上研究了立方晶系，六方晶系，四方晶系，正交晶系，单斜晶系，三斜晶系等电子衍射花样的标定．所做内容如下： 首先，阐述了本文意义和必要性．提出了立题依据．同时分析了常规立方，六方，四方，正交，单斜，三斜，高阶，孪晶结构电子衍射谱的形成原理和相关知识．研究了各种结构的标定方法，对各晶系常规衍射花样标定方法作了总结和分析，为电子衍射标定打下一个基础．
其次，研究了四方、六方晶系四十个基本膜面基矢转换原理，也研究了四方度对四方、六方晶系特征平行四边形表的影响因素和制定平行四边形表的方法. 我们选择了(c/a)2作为影响参数和区间转换点的参数，同时最初引入立方系同指数膜面的基矢作为四方、六方晶系膜面的基矢｡分析了四十个基本膜面的转换区间，并对每一个区间确定了基矢和倒易矢量及其顺序，对结果进行了验证｡ 在此基础上我们归纳了四方、六方晶系四十个基本膜面特征平四边形的变化 规律，分析了相同膜面随c/a的变化的规律，也探讨了立方晶系与四方、六方晶系特征平四边形表的区别与联系，并画出四方、六方晶系四十基本膜面在每一个区间的图形，并出其变化规律.在对前人的工作进行了大量的补充和校正的
基础上，研究并制定出了所有四方晶系物质均遵从的一个统一平行四边形表(包括膜面的图形)｡而不必像以前那样，为了标定四方系物质材料，去到处寻具有特定c/a值的平行四边形表，往往大多时候却不到(可以初步认为每种四方系物质，均有一个特定的c/a值，因而表也是特定的)，这是很有意义的工作。同时可将四方系和六方系四十个基本膜面的转换区间分别归纳为二十一个和十二个基本区间，每一个区间对应一个特征平行四边形表，绘出21个和12个这样的表，在四方、六方晶系的标定中也有用途。
再次，通过四方度对四方和六方晶系特征平行四边形表的影响分析，提出了对非立方晶系电子衍射花样标定的Matlab方法．同时，对于六方，正方，四方，单斜和三斜单晶电子衍射花样，我们用Matlab方法编制了其特征平行四边形表格．然后，对于一般工作者来说，由于他们看到的衍射图片大多在尺寸的大小可能已发生了改变，比如在已发表的论文中可能有一些电子衍射花样，由于各种原因尺寸发生变化，但其比例是不会变化的，所以提出了CAD软件量取尺寸法；
最后本文选了几个例子对其衍射花样进行了标定分析，验证了所制非立方晶触摸白板
系特征平行四边形表格的可行性。
关键词： 晶体结构；倒易点阵；衍射花样；标定
ABSTRACT
With the development of the modern science and technology, it’s requested that the material worker can provide the precise material information in time. Demarcating the electron diffraction pattern accurately is the important method of obtaining the material structure information, researching the material microscopic organization and the crystal structure of the solid sample. Therefore every material worker should master the accurate methods of demarcating the electron diffraction pattern, if possible.
闪光棒Based on the predecessor's foundation, this article improve on demarcating of the electron diffraction pattern of 7 crystalline systems, especially hexagonal system and square system, The research works as follows:
超导失超First, we elaborated the significance and necessity of the electron diffraction pattern and the reasons of this topic. At the same time the principle and relevant knowledge of the diffraction spectrum were introduced. We respectively studied the demarcate methods of electron diffraction pattern in the systems. A new scale method for the measure of the electron diffraction pattern is provided.
Secondly, we studied the conversion principle of 40 basic diffraction patterns on square crystal system and hexagonal crystal system. Then we also studied the impacts of quartet on square crystal
mntp
system and hexagonal crystal system. We chose (c/a) 2 as the impact parameter, whose values as the interval turning points. At the same time, we introduced the index of cubic diffraction pattern as the index of square crystal system and hexagonal crystal system. And then we analyzed conversion interval and set the reciprocal vector to every interval, then we proved the results.
On this basis, we summarized the law of the changes of the characteristic parallelogram grid of 40 basic diffraction pattern of the square crystal system and hexagonal crystal system, analyzed the changing law of the same diffraction pattern vary with the c / a, discussed the differences and relations of the characteristic parallelogram grid between cubic system and square, hexagonal crystal system and plotted the graphics at every range. On the basis of supplement and correction a large number of previous works, we studied and worked out a unified basic characteristic parallelogram grid (include the graphics of diffraction pattern) of the square system and hexagonal crystal system. It needn’t look around for the characteristic parallelogram grid that has a specific c / a value for demarcating, which was always
failed before. Thus this is a very significant work. At the same time the characteristic parallelogram grid is divided into 21 ranges in square system and 12 ranges in hexagonal crystal system and each interval has a corresponding the characteristic parallelogram grid. It will be useful to demarcating in t
he square crystal system and hexagonal crystal system.
Again, by the analysis on the characteristic parallelogram table of the square crystal system and hexagonal crystal system of quartet impacts, we have brought forward Matlab method to calibrate the non-cubic system electron diffraction pattern. We compiled the program in Matlab for the characteristic parallelogram grid of the electron diffraction pattern non- cubic crystal systems.
Then because of various cause, it may be a few change in the lengths of diffraction photographs, whose proportion may have not been changed. Therefore the methods of use the CAD software to measure the size was proposed. We have measured the lengths of diffraction photographs in CAD software.
简易过滤器Finally, we chosen several special examples and calibrated the diffraction pattern. Last we verified the feasibility of the characteristic parallelogram grid.
Key Words: crystal structure; reciprocal lattice; diffraction pattern; demarcate
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本人郑重声明：所呈交的论文是本人在导师的指导下独立进行研究所取得的研究成果。除了文中特别加以标注引用的内容外，本论文不包含任何其他个人或集体已经发表或撰写的成果作品。对本文的研究做出重要贡献的个人和集体，均已在文中以明确方式标明。本人完全意识到本声明的法律后果由本人承担。
作者签名：宋宝来日期： 2007 年12 月 09 日
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作者签名：宋宝来日期：2007 年 12 月 09日
导师签名： 廖世杰日期：2007 年 12 月 09 日
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