按摩脚盆
目的:
检查涂覆、电镀、化学镀所形成镀层厚度及其镀层均匀性
涂/镀层产品来料厚度检验
方法:
截面法(仲裁方法)
依据标准:
隧道隔音降噪施工截面法:GB/T 6462-2005,ASTM B 487-85(2002), ASTM B748-1990(2010)
X射线荧光膜厚法:ASTM B 568-98,GB/T 16921-2005,ISO 3497
典型图片:
链接:
一、截面法之显微镜测试
二、截面法之SEM测试
三、X射线荧光膜厚测试
链接一:截面法之显微镜测试
镀层厚度测量的最高倍数1000X,最低可测试至0.8µm
大圆针织机the Maximum magnification of the optical microscope is 1000X, the size measured can be as low as 0.8μm)
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铁基体上镀锌层厚度测量 Zn layer thickness measurement on iron substrate | 硬质合金丝锥
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渗碳层深度测量 The depth measurement of carburizing layer |
漆膜层厚度测量 |
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链接二:截面法之SEM测试
链接三:X射线荧光膜厚测试
X-RAY荧光测厚仪(X-Ray fluorescence thickness tester)
具体可针对如Sn/Fe(基材)、Zn/Cu(基材)、Ni/Cu汽车智能防盗系统(基材)、Cr/Ni/Fe(基材)、 Au/Ni/Cu(基材)等数十种电镀工艺镀层进行厚度测量,具有测量精度高、简便快捷、无损的优点,特别是对微薄镀层厚度(一般指小于0.2微米)测量效果较佳。
X-Ray fluorescence thickness tester, being highly accurate, fast and easy-to-operate, non-destructive, is mainly used for the thickness measurements of plating layers, such as Sn/Fe (substrate), Zn/Cu (substrate), Ni/Cu (substrate), Cr/Ni/Fe(substrate) and Au/Ni/Cu (substrate). Especially good for the thickness measurement of extra-thin coatings(generally less than 0.2 um).
典型样品: