Microsystems
CH-6060 Sarnen
Datasheet EMIRS200
Electrically modulated IR Source
Features
Thermal black body source
Broad band IR emission
Electronically pulsed, no moving parts
Fast heating and cooling rates
Wide modulation frequency band
Low power consumption
Long term stability
Compact packaging TO39, 3 pins
Applications
Infrared spectroscopy
Non dispersive infrared detection
Photacoustic gas detection
EMIRS200
Product Summary – principle of operation
The EMIRS200 is a versatile thermal infrared light emitter. The emission can be
directly modulated by varying the electrical input signal. This device is best suited to
replace existing, mechanically chopped lamp solutions, thus eliminating moving
parts. Conventional lamps with Tungsten filaments work under vacuum and are
therefore encapsulated in glass. This protection is no longer transparent for
wavelengths exceeding 5 µm and limits their application range. The EMIRS200
exhibits a broadband IR emission from NIR to 20 µm.
The EMIRS200 is based on a silicon chip using advanced microstructure fabrication
technologies. It consists of a thin film resistor supported on a thermally and
electrically insulating membrane. The heating relies on the Joule effect in the
microfilament. The low thermal mass of the supporting membrane structure permits
to heat and cool the microfilament with very short time constants of 11 ms and 17 ms
respectively. This allows a fast direct modulation of the emitted infrared light. A
unique patented technology allows manufacturing of highly reliable modulated IR
sources with true black body characteristics and very high emissivity. Emissivity
higher than 0.9 is achieved for wavelengths up to 15 µm.
EMIRS200 Preliminary Datasheet Feb. 2004 1/8
Microsystems
CH-6060 Sarnen
Datasheet EMIRS200
The main characteristic of heat
radiation is that absorption and
emission are equal when the device is
at thermal equilibrium. This means that
the higher the absorption, the higher
the emissivity. The emissivity of the
EMIRS200 microfilament is enhanced
by creating a random surface structure
as shown in figure 1. Incoming light is
absorbed by this surface resulting in a
low reflectivity. This is the reason why
the EMIRS200 sources appear black
and exhibit an excellent emissivity
Figure 1: SEM view of the structures enhancing the
close to 1.
emissivity of the device.
Absolute maximum ratings
Characteristics
Cold resistance
Operating Temperature
Storage temperature range
Rating
55
-20/+85
-40 /+125
Unit
Ohm
°C
°C
°C
Case temperature (cw, 600 mW) 90
Electrical/Optical characteristics (Tc=25°C)
Parameter
Cold Resistance
Hot Resistance
Electrical input power
Operating voltage
Operating current
Heating time constant
Cooling time constant
Peak emission wavelength
Emissivity
Lifetime (measured)
Heating area
Case Temperature
Min
35
0.9
Typ
45
72
450
5.7
80
11
17
4.0
0.95
>40’000
2.1x1.8
47
Max
55
6.3
90
Unit Conditions
Ω
Ω
mW
V
mA
ms
ms
µm
hours
450 mW
end of heating cycle
450 mW
450 mW
450 mW
VIS to 15 µm
50% duty cycle, 30 Hz, 450 mW,
ongoing measurement
2mm
°C 50% duty cycle; 450 mW
EMIRS200 Preliminary Datasheet Feb. 2004 2/8
Microsystems
CH-6060 Sarnen
Datasheet EMIRS200
Operating conditions
The source can be operated in continuous (cw) or in pulsed mode. Its fast heating
and cooling time constants of 11 ms and 17 ms respectively make it ideal for
detection schemes that rely on a modulated light source, such as photoacoustic
detection and phase sensitive techniques for the suppression of DC components and
the reduction of 1/f noise.
The heating element exhibits a high TCR value. This means that a current flowing
through the resistor induces a self-heating of the element and therefore an increase
in the resistor value. The data in figure 2. show the typical rise in resistance with
increasing electrical power.
61
U
[V]420100
I
[mA]50
060
Resistance
[Ω]R
[Ω]40200600
403020100P
[mW]40020001.00.50.0
E
[norm.]0500600
0.00.20.40.60.81.0Electric Power [mW] Time [s]
Figure 2: Typical increase of the source
resistance as a function of the electrical heating
power in thermal equlibrium. The dashed lines
indicate the range for the specified minimum
and maximum cold resistance values.
Figure 3: Time evolution of the driving voltage (V),
current (I), resitance (R), electrical power (P) and
total IR emission (E) of a typical IR source in
pulsed mode (voltage driven).
The source can driven with a square wave in constant voltage or in constant
current mode. The time evolution of the various parameters during a square wave
modulation with constant voltage is depicted in figure 3. Due to the lower resistance
at the beginning of the heating cycle, the current and the input power exhibit an
overshoot. Therefore the constant voltage mode supports slightly faster heating rates
compared to the constant current mode.
The frequency response of the total IR emission in figure 4 has been measured with
a driving square wave voltage of constant amplitude. The modulation depth is
EMIRS200 Preliminary Datasheet Feb. 2004 3/8
Microsystems
CH-6060 Sarnen
Datasheet EMIRS200
defined as the amplitude of the sine component at the fundamental frequency of the
driving square wave. A modulation depth of 50% is achieved at 24 Hz. The
modulation depth can be further enhanced significantly in a constant temperature
mode, i.e. the drive voltage is increased for higher frequencies to maintain the same
peak temperature at the end of the heating cycle. This mode works best for
asymmetric duty cycles with shorter heating periods.
Relative
Signal-Amplitude10.1110100Modulation Frequency [Hz]
Figure 4: Signal modulation depth of the total IR emission as a function of modulation frequency
(square wave voltage with constant amplitude, 50:50 duty cycle).
Emission spectrum
Figure 5: Typical emission spectra of the EMIRS200 for different electrical input powers.
The EMIRS200 exhibits true black-body characteristics. The emission spectra in
figure 5 have been measured with a Fourier transform IR spectrometer for different
electrical power levels. The measured curves have been fitted with a Planck
distribution function. The spectra show excellent agreement with the theoretical black
body emission. The extracted source temperature varies from 350°C to 550°C, the
peak wavelengths are situated at about 3.5 µm to 4.5 µm.
EMIRS200 Preliminary Datasheet Feb. 2004 4/8
Microsystems
CH-6060 Sarnen
600550
Datasheet EMIRS200
3.5Temperature
[°C]5505504.555.56600Electrical Power [mW]Figure 6: Source temperature and corresponding peak wavelength λmax versus electrical power as
extracted from the emission spectra.
λmax
[µm]4504
Lifetime
Lifetime tests are permanently ongoing. These are performed for square modulation
with 30 Hz frequency and 50 : 50 duty cycle at electrical power levels of 350 mW,
400 mW and 450 mW. Over the measured 40’000 h, no degradation has been
observed. The measured intensity variation was within the accuracy of the optical
detector (± 5%). The sources have been operated at ambient atmosphere, which
indicates that a hermetic sealing of the TO package is not required. The use of the
source at maximum ratings may result in a shorter life than operation at lower
temperatures.
110IR-Emission
in
%
of
Starting
Value1441200350 mW400 mW450mWTime [days]Figure 7: Long-term stability test lasting since more than 40’000 hours with power levels of 350 mW,
400 mW and 450 mW (30 Hz, 50:50 duty cycle).
EMIRS200 Preliminary Datasheet Feb. 2004 5/8
Microsystems
CH-6060 Sarnen
Datasheet EMIRS200
Case temperature
The temperature of the TO39 header has been measured at different power levels in
cw and pulsed mode.
100Temperature
[°C]806040cw50:50 duty cycle20500600Electrical Power [mW]Figure 8: Typical housing temperature (Tc=21°C) versus electrical power for cw and pulsed operation
(50:50 duty cycle).
EMIRS200 Preliminary Datasheet Feb. 2004 6/8
Microsystems
CH-6060 Sarnen
Datasheet EMIRS200
Packaging information
The device is supplied in a TO 39 header
type package with 3 pins. Pin 1 and 2 are
isolated and pin 3 is grounded. A cap with
round opening protects the silicon chip.
Standard executions are delivered
without protective window. Various
windows and filters are available on
request.
The typical weight of an EMIRS200 is
900 mg.
Soldering
The terminations of the TO39 package
consist of Nickel-plated Kovar and gold
finish. Hand soldering is mandatory.
Cleaning procedures are not
recommended as they might reduce the
emitting efficiency or even destroy the
device.
Pin-Out
Pin
1
2
3
Function
Heating resistor Rh
Heating resistor Rh
Ground
3
2
1
Figure 9: Package outline dimensions (in mm).
EMIRS200 Preliminary Datasheet Feb. 2004 7/8
Microsystems
CH-6060 Sarnen
Datasheet EMIRS200
ESD (Electrostatic discharge)
Electrostatic discharge and other current surges can cause deterioration and damage
of the IR source. Handling of the device has to be done according ESD rules.
Electronic circuitry should be designed to avoid the generation of excessive current
spikes when the power is turned on and the device should be protected against
electrostatic discharges.
Liability Policy
Technical data and specifications contained herein are subject to change without
prior notice.
As any semiconductor device, LEISTER Process Technologies micro-machined
devices have inherently a certain rate of failure. It is the responsibility of the buyer to
comply with the standards of safety in making a safe design for the entire system, to
protect against injury, damage or loss from such failures.
The products listed in this document are neither intended nor warranted for special
applications where failure or malfunction may affect human life or cause physical
injury or damage to property. LEISTER Process Technologies will not be responsible
for damage arising from such use.
USA Headquarter
LEISTER Process Technologies LEISTER Technologies LLC
Microsystems Division 1253 Hamilton Parkway
CH-6060 Sarnen/Switzerland Itasca, IL 60143/USA
phone (630) 760 1000 Phone + 41 41 662 74 74
Fax (630) 760 1001 Fax + 41 41 660 20 61
e-mail: microsystems@ e-mail: sales@
ISO 9001:2000 LEISTER Microsystems Exclusive Distributor
Copyright © 2004 LEISTER Process Technologies, Microsystems Division, CH-6060
Sarnen
EMIRS200 Preliminary Datasheet Feb. 2004 8/8
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